Relating critical currents to defect populations in superconductors

Long, N. J., Wimbush, S. C., Strickland, N. M., Talantsev, E. F., D'Souza, P., Xia, J. A. and Knibbe, R. (2013) Relating critical currents to defect populations in superconductors. IEEE Transactions on Applied Superconductivity, 23 3: . doi:10.1109/TASC.2012.2235116

Author Long, N. J.
Wimbush, S. C.
Strickland, N. M.
Talantsev, E. F.
D'Souza, P.
Xia, J. A.
Knibbe, R.
Title Relating critical currents to defect populations in superconductors
Journal name IEEE Transactions on Applied Superconductivity   Check publisher's open access policy
ISSN 1051-8223
Publication date 2013-06-01
Year available 2012
Sub-type Article (original research)
DOI 10.1109/TASC.2012.2235116
Open Access Status Not yet assessed
Volume 23
Issue 3
Total pages 5
Place of publication Piscataway, NJ, United States
Publisher Institute of Electrical and Electronics Engineers
Language eng
Abstract Analyzing critical currents from an information theoretic or statistical point of view allows one to identify distinct populations of microstates contributing to the critical current under particular conditions of temperature and applied field. We show how this knowledge can be correlated with the known microstructure of a sample to identify how different physical populations of pinning centers are contributing to these statistical populations of microstates. We will then show that by tracking the variation of critical current with temperature, field, and field angle we can construct a picture of the relative contributions of different defect populations under different conditions. We particularly focus our analysis on YBCO thin film coated conductors with potential commercial application.
Keyword Critical currents
Flux pinning
Q-Index Code C1
Q-Index Status Provisional Code
Institutional Status Non-UQ

Document type: Journal Article
Sub-type: Article (original research)
Collection: School of Mechanical & Mining Engineering Publications
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