Measurement of the thickness of a sporadic E-layer

Kantarizis E. (1971) Measurement of the thickness of a sporadic E-layer. Journal of Atmospheric and Terrestrial Physics, 33 10: . doi:10.1016/0021-9169(71)90083-3


Author Kantarizis E.
Title Measurement of the thickness of a sporadic E-layer
Journal name Journal of Atmospheric and Terrestrial Physics
ISSN 0021-9169
Publication date 1971-01-01
Sub-type Article (original research)
DOI 10.1016/0021-9169(71)90083-3
Volume 33
Issue 10
Total pages 1
Subject 1902 Film, Television and Digital Media
1908 Geophysics
Abstract A method is described for measuring the thickness of a sporadic E-layer from records obtained when using a Phase Ionosonde. The method involves the measurement of the phase advance, caused by the presence of a sporadic E-layer, on echoes from the F-region. One example is analysed in detail and it was found that the sporadic E-layer was a sharppeak layer, and its thickness at a plasma frequency equal to 90 per cent of its critical frequency was 5 km. The thickness of the same sporadic E-layer was also measured independently by performing a true-height reduction, by a polynomial method, using the phase of the echoes from the E-region of the ionosphere. The results obtained from the two methods were consistent.
Q-Index Code C1
Q-Index Status Provisional Code
Institutional Status Unknown

Document type: Journal Article
Sub-type: Article (original research)
Collection: Scopus Import
 
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Created: Tue, 28 Jun 2016, 17:13:00 EST by System User