Properties of CdTe films formed by compound vacuum evaporation

Winn M.B. and Lyons L.E. (1985) Properties of CdTe films formed by compound vacuum evaporation. Applied Surface Science, 22-23 PART 2: 724-730.

Author Winn M.B.
Lyons L.E.
Title Properties of CdTe films formed by compound vacuum evaporation
Journal name Applied Surface Science   Check publisher's open access policy
ISSN 0169-4332
Publication date 1985-01-01
Sub-type Article (original research)
Volume 22-23
Issue PART 2
Start page 724
End page 730
Total pages 7
Subject 3104 Condensed Matter Physics
2508 Surfaces, Coatings and Films
1606 Political Science
2200 Engineering
Abstract CdTe thin films formed by compound evaporation onto glass substrates, held at between 40 and 460°C, exhibited abrupt changes of physical properties at ca. 270°C. The resistivity changed from 0.1Ω m to 100 kΩ m, and a marked increase in crystallinity and absorption edge sharpness was noted. These changes resulted from a decrease in the free tellurium content of the films at ca. 270°C.
Q-Index Code C1
Q-Index Status Provisional Code
Institutional Status Unknown

Document type: Journal Article
Sub-type: Article (original research)
Collection: Scopus Import - Archived
 
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Created: Tue, 14 Jun 2016, 15:36:20 EST by System User