Transmission electron microscopy investigations of misfit dislocations in lattice mismatched semiconductor heterostructures

Zou, J. and Cockayne, D. J. H. (2001). Transmission electron microscopy investigations of misfit dislocations in lattice mismatched semiconductor heterostructures. In Xiao-Feng Zhang and Ze Zhang (Ed.), Progress in Transmission electron Microscopy 2: Applications in Materials Science (pp. 247-266) Berlin, Germany: Springer.

Author Zou, J.
Cockayne, D. J. H.
Title of chapter Transmission electron microscopy investigations of misfit dislocations in lattice mismatched semiconductor heterostructures
Title of book Progress in Transmission electron Microscopy 2: Applications in Materials Science
Place of Publication Berlin, Germany
Publisher Springer
Publication Year 2001
Sub-type Research book chapter (original research)
ISBN 3540676813
9783540676812
Editor Xiao-Feng Zhang
Ze Zhang
Chapter number 7
Start page 247
End page 266
Total pages 20
Total chapters 9
Language eng
Q-Index Code B1
Q-Index Status Provisional Code
Institutional Status Unknown

Document type: Book Chapter
Collection: Centre for Microscopy and Microanalysis Publications
 
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Created: Tue, 12 Apr 2016, 06:56:17 EST by Professor Jin Zou on behalf of Centre for Microscopy and Microanalysis