Structural changes on the nano-meter scale of thin Ag films on Si(1 1 1) surfaces by NO exposure

Glass, S., McFarland, E. W. and Nienhaus, H. (2002) Structural changes on the nano-meter scale of thin Ag films on Si(1 1 1) surfaces by NO exposure. Surface Science, 518 1-2: 133-140. doi:10.1016/S0039-6028(02)02118-0


Author Glass, S.
McFarland, E. W.
Nienhaus, H.
Title Structural changes on the nano-meter scale of thin Ag films on Si(1 1 1) surfaces by NO exposure
Journal name Surface Science   Check publisher's open access policy
ISSN 0039-6028
Publication date 2002-10-10
Sub-type Article (original research)
DOI 10.1016/S0039-6028(02)02118-0
Open Access Status Not yet assessed
Volume 518
Issue 1-2
Start page 133
End page 140
Total pages 8
Place of publication Amsterdam, Netherlands
Publisher Elsevier BV * North-Holland
Language eng
Formatted abstract
The low-temperature (180 K) interaction of NO molecules with thin Ag films deposited on hydrogen terminated Si(1 1 1) is investigated by X-ray photoelectron spectroscopy, scanning electron microscopy and chemicurrent measurements. The chemicurrent transients recorded from the thin film Ag/Si Schottky diodes demonstrate two maxima according to NO molecular adsorption and intermolecular reactions of (NO)2 dimer decomposition. Below a critical film thickness of 8 nm the original smooth Ag films are disrupted by the NO exposure leading to a nano-patterned network of coalescing Ag islands. Thicker films are stable upon NO exposure. Warming of NO-exposed diodes to room temperature changes the Ag/Si interface properties drastically by reducing the effective Schottky barrier height and increasing the diode's sensitivity to detect electrons excited in the metal. This is observed by enhanced maximum chemicurrents after annealing.
Keyword Metallic films
Nitrogen oxides
Scanning electron microscopy (SEM)
X-ray photoelectron spectroscopy
Q-Index Code C1
Q-Index Status Provisional Code
Institutional Status Non-UQ

Document type: Journal Article
Sub-type: Article (original research)
Collection: School of Chemical Engineering Publications
 
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