Sagnac-interferometer-based characterization of spatial light modulators

Tay, Jian Wei, Taylor, Michael A. and Bowen, Warwick P. (2009) Sagnac-interferometer-based characterization of spatial light modulators. Applied Optics, 48 12: 2236-2242. doi:10.1364/AO.48.002236


Author Tay, Jian Wei
Taylor, Michael A.
Bowen, Warwick P.
Title Sagnac-interferometer-based characterization of spatial light modulators
Journal name Applied Optics   Check publisher's open access policy
ISSN 1559-128X
Publication date 2009-04-14
Year available 2009
Sub-type Article (original research)
DOI 10.1364/AO.48.002236
Open Access Status Not yet assessed
Volume 48
Issue 12
Start page 2236
End page 2242
Total pages 7
Place of publication United States of America
Publisher OPTICAL SOC AMER
Language eng
Subject C1
970102 Expanding Knowledge in the Physical Sciences
020604 Quantum Optics
Abstract A method for characterizing the phase response of spatial light modulators (SLMs) by using a Sagnac interferometer is proposed and demonstrated. The method represents an improvement over conventional diffraction-based or interferometric techniques by providing a simple and accurate phase measurement while taking advantage of the inherent phase stability of a Sagnac interferometer. As a demonstration, the phase response of a commercial liquid crystal on a silicon SLM is characterized and then linearized by using a programmable lookup table. The transverse phase profile over the SLM surface is also measured.
Keyword generated holograms written
Q-Index Code C1
Q-Index Status Confirmed Code
Grant ID 06-UOO-129 PSE
NERFUOOX0703
DP0985078
Institutional Status UQ

Document type: Journal Article
Sub-type: Article (original research)
Collections: School of Mathematics and Physics
2010 Higher Education Research Data Collection
 
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Citation counts: TR Web of Science Citation Count  Cited 16 times in Thomson Reuters Web of Science Article | Citations
Scopus Citation Count Cited 16 times in Scopus Article | Citations
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Created: Thu, 03 Sep 2009, 18:11:02 EST by Mr Andrew Martlew on behalf of Physics