Self-mixing displacement sensing using the junction voltage variation in a GaN laser

Kliese, Russell, Lim, Yah Leng, Bertling, Karl, Bakar, A. Ashrif A., Bosch, Thierry and Rakic, Aleksandar D. (2008). Self-mixing displacement sensing using the junction voltage variation in a GaN laser. In: L. Faraone and M. Cortie, IEEE Proceedings of the 2008 Conference on Optoelectronic and Microelectronic Materials and Devices. 2008 Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2008), Sydney, Australia, (23-25). 28th July - 1st August, 2008. doi:10.1109/COMMAD.2008.4802083


Author Kliese, Russell
Lim, Yah Leng
Bertling, Karl
Bakar, A. Ashrif A.
Bosch, Thierry
Rakic, Aleksandar D.
Title of paper Self-mixing displacement sensing using the junction voltage variation in a GaN laser
Conference name 2008 Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 2008)
Conference location Sydney, Australia
Conference dates 28th July - 1st August, 2008
Convener Faraone, L.
Proceedings title IEEE Proceedings of the 2008 Conference on Optoelectronic and Microelectronic Materials and Devices
Journal name Commad: 2008 Conference On Optoelectronic and Microelectronic Materials
Place of Publication Piscataway, NJ, USA
Publisher IEEE
Publication Year 2008
Year available 2008
Sub-type Fully published paper
DOI 10.1109/COMMAD.2008.4802083
Open Access Status
ISBN 978-1-4244-2717-8
Editor L. Faraone
M. Cortie
Start page 23
End page 25
Total pages 3
Language eng
Abstract/Summary The self-mixing (SM) laser sensing technique allows a simple, self-aligned and robust system for measuring displacement. Low-cost blue emitting GaN laser diodes have recently become available due to the high volume requirements for Blu-ray disc devices such as high-definition video players and gaming consoles. These GaN lasers have a significantly shorter wavelength (around 405 nm) compared to other semiconductor lasers (generally around 800 nm for SM sensors). Therefore, if used in SM displacement sensors, they provide significantly higher resolution. Further to that, the measurement resolution is affected by the ability of the system to properly interpret the movement corresponding to the fraction of the half wavelength of the laser resulting in an incomplete fringe. Doubling the number of fringes will reduce the global error when a fringe is not properly detected. In this paper we report the world's first SM displacement measurement system based on junction voltage variation in blue emitting semiconductor lasers. Instead of monitoring the SM signals using a photo-diode, the signal is obtained via direct sensing of the laser junction voltage variation. This removes the need for a photo-diode, providing a cost reduction and increasing the reliability of the system. The sensitivity and precision of this system is evaluated and compared against the performance of systems using red (650 nm) and near IR (780 nm) laser based sensors with all three sensors sharing the same optical and electronic hardware.
Subjects E1
970109 Expanding Knowledge in Engineering
020504 Photonics, Optoelectronics and Optical Communications
020502 Lasers and Quantum Electronics
Keyword Engineering, Electrical & Electronic
Nanoscience & Nanotechnology
Optics
Engineering
Science & Technology - Other Topics
Optics
Q-Index Code E1
Q-Index Status Confirmed Code
Institutional Status UQ

Document type: Conference Paper
Sub-type: Fully published paper
Collections: 2009 Higher Education Research Data Collection
School of Information Technology and Electrical Engineering Publications
 
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Created: Tue, 14 Apr 2009, 00:13:10 EST by Donna Clark on behalf of School of Information Technol and Elec Engineering