Search for new diagnostics for metal oxide surge arrester

Mardira, K. P., Darveniza, M. and Saha, T. K. (2000). Search for new diagnostics for metal oxide surge arrester. In: Proceedings of IEEE: 6th International Conference on Properties and Applications of Dielectric Materials (ICPADM'2000). ICPADM 2000, Xian, China, (947-950). 21-26 June 2000. doi:10.1109/ICPADM.2000.876387


Author Mardira, K. P.
Darveniza, M.
Saha, T. K.
Title of paper Search for new diagnostics for metal oxide surge arrester
Conference name ICPADM 2000
Conference location Xian, China
Conference dates 21-26 June 2000
Proceedings title Proceedings of IEEE: 6th International Conference on Properties and Applications of Dielectric Materials (ICPADM'2000)
Journal name Proceedings of the 6th International Conference On Properties and Applications of Dielectric Materials, Vols 1
Place of Publication Piscataway
Publisher IEEE
Publication Year 2000
Sub-type Fully published paper
DOI 10.1109/ICPADM.2000.876387
ISBN 0-7803-5453-1
Volume 2
Start page 947
End page 950
Total pages 4
Language eng
Abstract/Summary A new diagnostic technique called “return voltage measurement” is investigated to assess its effectiveness for monitoring degradation in metal oxide blocks. The return voltage measurement was conducted on a number of distribution class zinc-oxide arresters. The findings from these measurements are described in this paper. The first part describes some results on the reproducibility of return voltage measurements and also the polarity effects on measurements. The second part presents the results of monitoring the arresters while being subjected to elevated temperatures using the return voltage measurement.
Subjects E2
290901 Electrical Engineering
669900 Other
Q-Index Code E2

 
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Created: Fri, 06 Jun 2008, 23:53:39 EST