Atomic composition profile change of SiGe islands during Si capping

Li, F. H., Fan, Y. L., Yang, X. J., Jiang, Z. M., Wu, Q. and Zou, J. (2006) Atomic composition profile change of SiGe islands during Si capping. Applied Physics Letters, 89 10: 103108-1-103108-3. doi:10.1063/1.2345589

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Author Li, F. H.
Fan, Y. L.
Yang, X. J.
Jiang, Z. M.
Wu, Q.
Zou, J.
Title Atomic composition profile change of SiGe islands during Si capping
Journal name Applied Physics Letters   Check publisher's open access policy
ISSN 0003-6951
Publication date 2006
Sub-type Article (original research)
DOI 10.1063/1.2345589
Open Access Status File (Publisher version)
Volume 89
Issue 10
Start page 103108-1
End page 103108-3
Total pages 3
Editor Nghi Q. Lam
Place of publication USA
Publisher American Institute of Physics
Collection year 2006
Language eng
Subject C1
291804 Nanotechnology
240202 Condensed Matter Physics - Structural Properties
291499 Materials Engineering not elsewhere classified
780102 Physical sciences
680399 Other
671699 Manufactured products not elsewhere classified
Abstract The 6% Ge isocomposition profile change of individual SiGe islands during Si capping at 640 degrees C is investigated by atomic force microscopy combined with a selective etching procedure. The island shape transforms from a dome to a {103}-faceted pyramid at a Si capping thickness of 0.32 nm, followed by the decreasing of pyramid facet inclination with increasing Si capping layer thickness. The 6% Ge isocomposition profiles show that the island with more highly Si enriched at its one base corner before Si capping becomes to be more highly Si intermixed along pyramid base diagonals during Si capping. This Si enrichment evolution inside an island during Si capping can be attributed to the exchange of capped Si atoms that aggregated to the island by surface diffusion with Ge atoms from inside the island by both atomic surface segregation and interdiffusion rather than to the atomic interdiffusion at the interface between the island and the Si substrate. In addition, the observed Si enrichment along the island base diagonals is attempted to be explained on the basis of the elastic constant anisotropy of the Si and Ge materials in (001) plane. (c) 2006 American Institute of Physics.
Q-Index Code C1

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Created: Wed, 15 Aug 2007, 10:49:42 EST