The discriminative bilateral filter: An enhanced denoising filter for electron microscopy data

Pantelic, R. S., Rothnagel, A. R., Huang, C. Y., Muller, D. A., Woolford, D., Landsberg, M. J., McDowall, A. W., Pailthorpe, B., Young, P. R., Banks, J. E., Hankamer, B. and Ericksson, G. B. (2006) The discriminative bilateral filter: An enhanced denoising filter for electron microscopy data. Journal Of Structural Biology, 155 3: 395-408. doi:10.1016/j.jsb.2006.03.030

Author Pantelic, R. S.
Rothnagel, A. R.
Huang, C. Y.
Muller, D. A.
Woolford, D.
Landsberg, M. J.
McDowall, A. W.
Pailthorpe, B.
Young, P. R.
Banks, J. E.
Hankamer, B.
Ericksson, G. B.
Title The discriminative bilateral filter: An enhanced denoising filter for electron microscopy data
Journal name Journal Of Structural Biology   Check publisher's open access policy
ISSN 1047-8477
Publication date 2006-09
Sub-type Article (original research)
DOI 10.1016/j.jsb.2006.03.030
Volume 155
Issue 3
Start page 395
End page 408
Total pages 14
Place of publication San Diego
Publisher Academic Press Inc Elsevier Science
Collection year 2006
Language eng
Subject C1
249901 Biophysics
671401 Scientific instrumentation
Abstract Advances in three-dimensional (313) electron microscopy (EM) and image processing are providing considerable improvements in the resolution of subcellular volumes, macromolecular assemblies and individual proteins. However, the recovery of high-frequency information from biological samples is hindered by specimen sensitivity to beam damage. Low dose electron cryo-microscopy conditions afford reduced beam damage but typically yield images with reduced contrast and low signal-to-noise ratios (SNRs). Here, we describe the properties of a new discriminative bilateral (DBL) filter that is based upon the bilateral filter implementation of Jiang et al. (Jiang, W., Baker, M.L., Wu, Q., Bajaj, C., Chin, W., 2003. Applications of a bilateral denoising filter in biological electron microscopy. J. Struc. Biol. 128, 82-97.). In contrast to the latter, the DBL filter can distinguish between object edges and high-frequency noise pixels through the use of an additional photometric exclusion function. As a result, high frequency noise pixels are smoothed, yet object edge detail is preserved. In the present study, we show that the DBL filter effectively reduces noise in low SNR single particle data as well as cellular tomograms of stained plastic sections. The properties of the DBL filter are discussed in terms of its usefulness for single particle analysis and for pre-processing cellular tomograms ahead of image segmentation. (c) 2006 Elsevier Inc. All rights reserved.
Keyword electron microscopy
electron cryo-microscopy
cryo-electron microscopy
single particle analysis
impulse noise reduction
Angstrom Resolution
Ccd Camera
Q-Index Code C1

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Created: Wed, 15 Aug 2007, 09:19:46 EST