Advanced transmission electron microscopy characterization of semiconductor quantum structures

Zou, J, Liao, X, Keast, V J and Cockayne, D J H (2006). Advanced transmission electron microscopy characterization of semiconductor quantum structures. In A A Balandin and K L Wang (Ed.), Handbook of Semiconductor Nanostructures and Nanodevices. Volume 2 (pp. 61-92) USA: American Scientific Publishers.

Author Zou, J
Liao, X
Keast, V J
Cockayne, D J H
Title of chapter Advanced transmission electron microscopy characterization of semiconductor quantum structures
Title of book Handbook of Semiconductor Nanostructures and Nanodevices. Volume 2
Place of Publication USA
Publisher American Scientific Publishers
Publication Year 2006
Sub-type Research book chapter (original research)
ISBN 1588830756
Editor A A Balandin and K L Wang
Start page 61
End page 92
Total pages 32
Total chapters 22
Collection year 2006
Subjects 291804 Nanotechnology
240202 Condensed Matter Physics - Structural Properties
291499 Materials Engineering not elsewhere classified
780102 Physical sciences
680399 Other
671699 Manufactured products not elsewhere classified
B1
Q-Index Code B1

 
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Created: Tue, 14 Aug 2007, 12:52:04 EST