Amorphous structures induced in monocrystalline silicon by mechanical loading

Zarudi, I., Zou, J., McBride, W. and Zhang, L. C. (2004) Amorphous structures induced in monocrystalline silicon by mechanical loading. Applied Physics Letters, 85 6: 932-934.


Author Zarudi, I.
Zou, J.
McBride, W.
Zhang, L. C.
Title Amorphous structures induced in monocrystalline silicon by mechanical loading
Journal name Applied Physics Letters   Check publisher's open access policy
ISSN 0003-6951
Publication date 2004
Sub-type Article (original research)
DOI 10.1063/1.1779344
Volume 85
Issue 6
Start page 932
End page 934
Total pages 3
Editor Lam, N. Q.
Place of publication USA
Publisher American Institute Physics
Collection year 2004
Language eng
Subject C1
291499 Materials Engineering not elsewhere classified
291702 Optical and Photonic Systems
291804 Nanotechnology
780199 Other
Abstract Different amorphous structures have been induced in monocrystalline silicon by high pressure in indentation and polishing. Through the use of high-resolution transmission electron microscopy and nanodiffraction, it was found that the structures of amorphous silicon formed at slow and fast loading/unloading rates are dissimilar and inherit the nearest-neighbor distance of the crystal in which they are formed. The results are in good agreement with recent theoretical predictions. (C) 2004 American Institute of Physics.
Keyword Physics, Applied
Transmission Electron-microscopy
Phase-transformations
Cyclic Microindentations
Spherical Indenter
Indentation
Crystal
Nanoindentation
Microstructure
Amorphization
Deformation
Q-Index Code C1

 
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