Quantitative X-ray diffraction analysis of titanate waste forms and its application to damage ingrowth

White T.J. and Mitamura H. (1993). Quantitative X-ray diffraction analysis of titanate waste forms and its application to damage ingrowth. In: Proceedings of the 16th International Symposium on the Scientific Basis for Nuclear Waste Management, Boston, MA, USA, (109-116). November 30, 1992-December 4, 1992.

Author White T.J.
Mitamura H.
Title of paper Quantitative X-ray diffraction analysis of titanate waste forms and its application to damage ingrowth
Conference name Proceedings of the 16th International Symposium on the Scientific Basis for Nuclear Waste Management
Conference location Boston, MA, USA
Conference dates November 30, 1992-December 4, 1992
Journal name Materials Research Society Symposium Proceedings   Check publisher's open access policy
Series Materials Research Society Symposium Proceedings
Publisher Publ by Materials Research Society
Publication Year 1993
Sub-type Fully published paper
ISBN 1558991891
ISSN 0272-9172
Volume 294
Start page 109
End page 116
Total pages 8
Subjects 2504 Electronic, Optical and Magnetic Materials
Q-Index Code E1
Q-Index Status Provisional Code
Institutional Status Unknown

Document type: Conference Paper
Collection: Scopus Import
 
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Created: Tue, 28 Jun 2016, 05:01:50 EST by System User