XPS analysis of oxide films on lead-free solders with trace additions of germanium and gallium

Watling, K. M., Chandler-Temple, A. and Nogita, K. (2016). XPS analysis of oxide films on lead-free solders with trace additions of germanium and gallium. In: Mohd Mustafa Al Bakri Abdullah, Liyana Jamaludin, Rafiza Abd Razak and Muhammad Faheem Mohd Tahir, Advanced Materials Engineering and Technology IV. International Conference on Advanced Materials Engineering and Technology, ICAMET 2015, Kaohsiung, Taiwan, (63-67). 4-5 December 2015. doi:10.4028/www.scientific.net/MSF.857.63


Author Watling, K. M.
Chandler-Temple, A.
Nogita, K.
Title of paper XPS analysis of oxide films on lead-free solders with trace additions of germanium and gallium
Conference name International Conference on Advanced Materials Engineering and Technology, ICAMET 2015
Conference location Kaohsiung, Taiwan
Conference dates 4-5 December 2015
Proceedings title Advanced Materials Engineering and Technology IV   Check publisher's open access policy
Journal name Materials Science Forum   Check publisher's open access policy
Place of Publication Pfaffikon, Switzerland
Publisher Trans Tech Publications
Publication Year 2016
Year available 2016
Sub-type Fully published paper
DOI 10.4028/www.scientific.net/MSF.857.63
Open Access Status Not Open Access
ISBN 9783035710205
ISSN 0255-5476
1662-9752
Editor Mohd Mustafa Al Bakri Abdullah
Liyana Jamaludin
Rafiza Abd Razak
Muhammad Faheem Mohd Tahir
Volume 857
Start page 63
End page 67
Total pages 5
Collection year 2017
Language eng
Abstract/Summary A sessile drop experiment involving slow heating and cooling of lead-free solder alloys under inert gas revealed segregation of trace elements to the sample surface. Addition of germanium or gallium to Sn-0.7Cu-0.05Ni alloys promoted a metallic lustre in samples, in contrast with the blue/purple colour of the parent alloy. Alloys with Ge or Ga additions showed oxidation resistance. Depth profiling of surfaces of sample alloys with Ge or Ga showed a significant concentration of these elements within the oxide film, which may be responsible for oxidation resistance of these alloys.
Keyword Gallium
Germanium
Lead-free solder
Oxide
X-ray photoelectron spectroscopy
Q-Index Code C1
Q-Index Status Provisional Code
Institutional Status UQ

 
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