Effect of a high density of stacking faults on the Young's modulus of GaAs nanowires

Chen, Yujie, Burgess, Tim, An, Xianghai, Mai, Yiu-Wing, Tan, H. Hoe, Zou, Jin, Ringer, Simon P., Jagadish, Chennupati and Liao, Xiaozhou (2016) Effect of a high density of stacking faults on the Young's modulus of GaAs nanowires. Nano Letters, 16 3: 1911-1916. doi:10.1021/acs.nanolett.5b05095


Author Chen, Yujie
Burgess, Tim
An, Xianghai
Mai, Yiu-Wing
Tan, H. Hoe
Zou, Jin
Ringer, Simon P.
Jagadish, Chennupati
Liao, Xiaozhou
Title Effect of a high density of stacking faults on the Young's modulus of GaAs nanowires
Journal name Nano Letters   Check publisher's open access policy
ISSN 1530-6992
1530-6984
Publication date 2016-03-09
Year available 2016
Sub-type Article (original research)
DOI 10.1021/acs.nanolett.5b05095
Open Access Status Not Open Access
Volume 16
Issue 3
Start page 1911
End page 1916
Total pages 6
Place of publication Washington, DC United States
Publisher American Chemical Society
Collection year 2017
Language eng
Abstract Stacking faults (SFs) are commonly observed crystalline defects in III–V semiconductor nanowires (NWs) that affect a variety of physical properties. Understanding the effect of SFs on NW mechanical properties is critical to NW applications in nanodevices. In this study, the Young’s moduli of GaAs NWs with two distinct structures, defect-free single crystalline wurtzite (WZ) and highly defective wurtzite containing a high density of SFs (WZ-SF), are investigated using combined in situ compression transmission electron microscopy and finite element analysis. The Young’s moduli of both WZ and WZ-SF GaAs NWs were found to increase with decreasing diameter due to the increasing volume fraction of the native oxide shell. The presence of a high density of SFs was further found to increase the Young’s modulus by 13%. This stiffening effect of SFs is attributed to the change in the interatomic bonding configuration at the SFs.
Keyword GaAs nanowires
In situ deformation
Stacking faults
Transmission electron microscopy
Young's modulus
Q-Index Code C1
Q-Index Status Provisional Code
Institutional Status UQ

Document type: Journal Article
Sub-type: Article (original research)
Collections: HERDC-Related Documentation
School of Mechanical & Mining Engineering Publications
 
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