Quantitative surface analysis of hemp fibers using XPS, conventional and low voltage in-lens SEM

Truss, Rowan W., Wood, Barry and Rasch, Ron (2016) Quantitative surface analysis of hemp fibers using XPS, conventional and low voltage in-lens SEM. Journal of Applied Polymer Science, 133 8: 1-9. doi:10.1002/app.43023


Author Truss, Rowan W.
Wood, Barry
Rasch, Ron
Title Quantitative surface analysis of hemp fibers using XPS, conventional and low voltage in-lens SEM
Journal name Journal of Applied Polymer Science   Check publisher's open access policy
ISSN 1097-4628
0021-8995
Publication date 2016-02-02
Sub-type Article (original research)
DOI 10.1002/app.43023
Volume 133
Issue 8
Start page 1
End page 9
Total pages 9
Place of publication Hoboken, NJ, United States
Publisher John Wiley and Sons
Collection year 2017
Language eng
Keyword Biomaterials
Composites
Fibers
Microscopy
Surfaces and interfaces
Q-Index Code C1
Q-Index Status Provisional Code
Institutional Status UQ

Document type: Journal Article
Sub-type: Article (original research)
Collections: School of Mechanical & Mining Engineering Publications
HERDC Pre-Audit
Centre for Microscopy and Microanalysis Publications
 
Versions
Version Filter Type
Citation counts: TR Web of Science Citation Count  Cited 0 times in Thomson Reuters Web of Science Article
Scopus Citation Count Cited 0 times in Scopus Article
Google Scholar Search Google Scholar
Created: Sun, 31 Jan 2016, 00:24:49 EST by System User on behalf of Learning and Research Services (UQ Library)