Microsphere tensiometry to determine contact angles on individual particles

Butt, HJ, Ecke, S, Heim, LO, Heiskanen, K, Preuss, M, Raiteri, R, Schreithofer, N, Vinogradova, OI and Yakubov, GE (2002). Microsphere tensiometry to determine contact angles on individual particles. In: Contact Angle, Wettability and Adhesion, Vol 2. 2nd International Symposium on Contact Angle, Wettability and Adhesion, Newark Nj, (201-214). Jun 21-23, 2000.

Author Butt, HJ
Ecke, S
Heim, LO
Heiskanen, K
Preuss, M
Raiteri, R
Schreithofer, N
Vinogradova, OI
Yakubov, GE
Title of paper Microsphere tensiometry to determine contact angles on individual particles
Conference name 2nd International Symposium on Contact Angle, Wettability and Adhesion
Conference location Newark Nj
Conference dates Jun 21-23, 2000
Proceedings title Contact Angle, Wettability and Adhesion, Vol 2
Publication Year 2002
Sub-type Fully published paper
ISBN 90-6764-370-X
Start page 201
End page 214
Total pages 14
Language eng
Keyword atomic force microscope
contact angle
flotation
line tension
particle
surface force
Atomic Force Microscope
Sphere Tensiometry
Surface-Tension
Capillary Rise
Liquid
Electrolyte
Interfaces
Line
Q-Index Code E1
Q-Index Status Provisional Code
Institutional Status Unknown

Document type: Conference Paper
Collection: WoS Import
 
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Created: Fri, 15 May 2015, 04:12:12 EST by Gleb Yakubov