Subsurface particle analysis using x-ray computed tomography and confocal x-ray fluorescence

Cordes, Nikolaus L., Seshadri, Srivatsan, Havrilla, George J., Patterson, Brian M., Michael Feser,, Yuan, Xiaoli, Gu, Ying and Wang, Deming (2014). Subsurface particle analysis using x-ray computed tomography and confocal x-ray fluorescence. In: Robert L. Price, Proceedings of Microscopy & Microanalysis 2014. M&M 2014: Microscopy and Microanalysis 2014, Hartford, CT, USA, (778-779). 3-7 August, 2014. doi:10.1017/S1431927614005613

Author Cordes, Nikolaus L.
Seshadri, Srivatsan
Havrilla, George J.
Patterson, Brian M.
Michael Feser,
Yuan, Xiaoli
Gu, Ying
Wang, Deming
Title of paper Subsurface particle analysis using x-ray computed tomography and confocal x-ray fluorescence
Conference name M&M 2014: Microscopy and Microanalysis 2014
Conference location Hartford, CT, USA
Conference dates 3-7 August, 2014
Proceedings title Proceedings of Microscopy & Microanalysis 2014   Check publisher's open access policy
Journal name Microscopy and Microanalysis   Check publisher's open access policy
Place of Publication Cambridge, United Kingdom
Publisher Cambridge University Press
Publication Year 2014
Sub-type Published abstract
DOI 10.1017/S1431927614005613
Open Access Status
ISSN 1431-9276
Editor Robert L. Price
Volume 20
Issue Supp. S3
Start page 778
End page 779
Total pages 2
Language eng
Formatted Abstract/Summary
Rapid screening of particulate samples is critical in confirming or denying the presence of elements of interest. Typically, high atomic number particles found on waste air filters or precious metals within minerals require a complex dissolution and/or chemical analysis to detect them, without giving any information on size or shape morphology. For this measurement, electron microscopy (which is performed separately) is required. However, secondary electron microscopy-based energy dispersive spectroscopy is limited to the top 1 μm to 5 μm of the sample; using this technique to interrogate elements below the sample surface typically involves destructive methods, such as focused ion beam (FIB) ablation. Micro X-ray fluorescence spectroscopy (micro-XRF) instruments, while able to detect sub-surface particles, are limited in that they cannot easily distinguish surface from sub-surface particles. The depth discrimination limitations of micro-XRF can be overcome by confocal micro-XRF which allows for the spatial discrimination of X-ray fluorescence signals in all three spatial axes and allows for the detection, identification, and (with standards and modeling) quantification of the elements present at depth...
Q-Index Code EX
Q-Index Status Provisional Code
Institutional Status UQ

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Created: Tue, 17 Mar 2015, 10:01:30 EST by Alice Militon on behalf of Julius Kruttschnitt Mineral Research Centre