Effect of injection current and temperature on signal strength in a laser diode optical feedback interferometer

Al Roumy, Jalal, Perchoux, Julien, Lim, Yah Leng, Taimre, Thomas, Rakic, Aleksandar D. and Bosch, Thierry (2015) Effect of injection current and temperature on signal strength in a laser diode optical feedback interferometer. Applied Optics, 54 2: 312-318. doi:10.1364/AO.54.000312


Author Al Roumy, Jalal
Perchoux, Julien
Lim, Yah Leng
Taimre, Thomas
Rakic, Aleksandar D.
Bosch, Thierry
Title Effect of injection current and temperature on signal strength in a laser diode optical feedback interferometer
Journal name Applied Optics   Check publisher's open access policy
ISSN 1559-128X
2155-3165
Publication date 2015-01-10
Year available 2015
Sub-type Article (original research)
DOI 10.1364/AO.54.000312
Open Access Status
Volume 54
Issue 2
Start page 312
End page 318
Total pages 7
Place of publication Washington, DC United States
Publisher Optical Society of America
Collection year 2016
Language eng
Abstract We present a simple analytical model that describes the injection current and temperature dependence of optical feedback interferometry signal strength for a single-mode laser diode. The model is derived from the Lang and Kobayashi rate equations, and is developed both for signals acquired from the monitoring photodiode (proportional to the variations in optical power) and for those obtained by amplification of the corresponding variations in laser voltage. The model shows that both the photodiode and the voltage signal strengths are dependent on the laser slope efficiency, which itself is a function of the injection current and the temperature. Moreover, the model predicts that the photodiode and voltage signal strengths depend differently on injection current and temperature. This important model prediction was proven experimentally for a near-infrared distributed feedback laser by measuring both types of signals over a wide range of injection currents and temperatures. Therefore, this simple model provides important insight into the radically different biasing strategies required to achieve optimal sensor sensitivity for both interferometric signal acquisition schemes.
Keyword Semiconductor-lasers
Voltage
Noise
Q-Index Code C1
Q-Index Status Confirmed Code
Institutional Status UQ

Document type: Journal Article
Sub-type: Article (original research)
Collections: School of Mathematics and Physics
Official 2016 Collection
School of Information Technology and Electrical Engineering Publications
 
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