Charge transport features in disordered organic materials measured by time-of-flight (TOF), xerographic discharge (XTOF) and charge extraction by linearly increasing voltage (CELIV) techniques

Pivrikas, A. and Kepler, Johannes (2013). Charge transport features in disordered organic materials measured by time-of-flight (TOF), xerographic discharge (XTOF) and charge extraction by linearly increasing voltage (CELIV) techniques. In Handbook of Organic Materials for Optical and (Opto)electronic Devices: Properties and Applications (pp. 398-420) Sawston, Cambridge, UK: Woodhead Publishing. doi:10.1533/9780857098764


Author Pivrikas, A.
Kepler, Johannes
Title of chapter Charge transport features in disordered organic materials measured by time-of-flight (TOF), xerographic discharge (XTOF) and charge extraction by linearly increasing voltage (CELIV) techniques
Title of book Handbook of Organic Materials for Optical and (Opto)electronic Devices: Properties and Applications
Place of Publication Sawston, Cambridge, UK
Publisher Woodhead Publishing
Publication Year 2013
Sub-type Chapter in reference work, encyclopaedia, manual or handbook
DOI 10.1533/9780857098764
Open Access Status
Series Woodhead Publishing Series in Electronic and Optical Materials
ISBN 9780857092656
9780857098764
ISSN 2050-1501
2050-151X
Volume number 39
Chapter number 14
Start page 398
End page 420
Total pages 23
Total chapters 25
Language eng
Formatted Abstract/Summary
In conjunction with various photophysical processes the charge transport largely determines the performance of electronic devices. In the past a vast number of techniques have been used to study transport in various types of semiconductors. Although some techniques are relatively simple to use, the interpretation of results is not so straightforward. Therefore, it is important to understand the limitations and applicability of these techniques when measuring the charge carrier mobility and recombination. In this work, the most commonly used charge transport techniques are presented. The advantages and disadvantages of time-of-flight (TOF), xerographic discharge (XTOF) and charge extraction by linearly increasing voltage (CELIV) techniques are discussed in detail. Various possible and technique-specific experimental conditions are used to demonstrate the quirks of each technique. It is shown how experimental data obtained using these techniques represent the charge carrier transport and how the results compare. Dispersive charge transport models in the framework of Gaussian density-of-states are used to explain the observed features of charge transport in disordered organic semiconductors.
Keyword Charge transport
Charge carrier mobility
Time-of-flight (TOF)
Charge extraction by linearly increasing voltage (CELIV)
Organic semiconductors
Heterojunction solar-cells
Poole-Frenkel conduction
Light-emitting-diodes
Carrier mobility
Hole transport
Poly(p-phenylene vinylene)
Photophysical properties
Dispersive transport
Amorphous solids
Electric-field
Q-Index Code CX
Q-Index Status Provisional Code
Institutional Status UQ

 
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