Determination of fullerene scattering length density: a critical parameter for understanding the fullerene distribution in bulk heterojunction organic photovoltaic devices

Clulow, Andrew J., Armin, Ardalan, Lee, Kwan H., Pandey, Ajay K., Tao, Chen, Velusamy, Marappan, James, Michael, Nelson, Andrew, Burn, Paul L., Gentle, Ian R. and Meredith, Paul (2014) Determination of fullerene scattering length density: a critical parameter for understanding the fullerene distribution in bulk heterojunction organic photovoltaic devices. Langmuir, 30 5: 1410-1415. doi:10.1021/la403951j


Author Clulow, Andrew J.
Armin, Ardalan
Lee, Kwan H.
Pandey, Ajay K.
Tao, Chen
Velusamy, Marappan
James, Michael
Nelson, Andrew
Burn, Paul L.
Gentle, Ian R.
Meredith, Paul
Title Determination of fullerene scattering length density: a critical parameter for understanding the fullerene distribution in bulk heterojunction organic photovoltaic devices
Journal name Langmuir   Check publisher's open access policy
ISSN 0743-7463
1520-5827
Publication date 2014-02-11
Year available 2014
Sub-type Article (original research)
DOI 10.1021/la403951j
Open Access Status
Volume 30
Issue 5
Start page 1410
End page 1415
Total pages 6
Place of publication Washington, United States
Publisher American Chemical Society
Collection year 2015
Language eng
Formatted abstract
Fullerene derivatives are commonly used as electron acceptors in combination with (macro)molecular electron donors in bulk heterojunction (BHJ) organic photovoltaic (OPV) devices. Understanding the BHJ structure at different electron donor/acceptor ratios is critical to the continued improvement and development of OPVs. The high neutron scattering length densities (SLDs) of the fullerenes provide effective contrast for probing the distribution of the fullerene within the blend in a nondestructive way. However, recent neutron scattering studies on BHJ films have reported a wide range of SLDs ((3.6-4.4) × 10-6 Å-2) for the fullerenes 60-PCBM and 70-PCBM, leading to differing interpretations of their distribution in thin films. In this article, we describe an approach for determining more precisely the scattering length densities of the fullerenes within a polymer matrix in order to accurately quantify their distribution within the active layers of OPV devices by neutron scattering techniques.
Q-Index Code C1
Q-Index Status Confirmed Code
Institutional Status UQ

 
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