Energy filtered low voltage "in lens detector" SEM and XPS of natural fiber surfaces

Rasch, Ron, Stricher, Arthur and Truss, Rowan (2013) Energy filtered low voltage "in lens detector" SEM and XPS of natural fiber surfaces. Journal of Applied Polymer Science, 131 9: 1-7. doi:10.1002/app.39572

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Author Rasch, Ron
Stricher, Arthur
Truss, Rowan
Title Energy filtered low voltage "in lens detector" SEM and XPS of natural fiber surfaces
Journal name Journal of Applied Polymer Science   Check publisher's open access policy
ISSN 0021-8995
Publication date 2013-06-14
Year available 2013
Sub-type Article (original research)
DOI 10.1002/app.39572
Volume 131
Issue 9
Start page 1
End page 7
Total pages 7
Place of publication Hoboken, NJ, United States
Publisher John Wiley & Sons
Collection year 2014
Language eng
Formatted abstract
Most analyses of natural fibers give the average composition of the fiber and not the nature and distribution of surface species present. The nature of the fiber surface is important since it governs interfacial adhesion between fiber and matrix and the transfer of stress to the fiber in composite materials. The surface of caustic treated flax fibers is analyzed using X-ray photoelectron spectroscopy (XPS) and a low voltage scanning electron microscopy (SEM) technique that uses a filtered in-lens electron detector. XPS shows that the fiber surface is not composed of a single polymer but is a mixture of materials, probably degraded lignin and hemicellulose and extractives. The SEM technique shows patches of material on the surface with different contrast and this contrast is shown to result from different average atomic number (Z). The variation in surface composition has obvious implication in variable interfacial properties in composites made using natural fibers.
Keyword Composites
Surfaces and interfaces
Q-Index Code C1
Q-Index Status Confirmed Code
Institutional Status UQ
Additional Notes Article first published online: 14 JUN 2013

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Created: Fri, 29 Nov 2013, 10:39:42 EST by Katie Gollschewski on behalf of Centre for Microscopy and Microanalysis