Fluorine mobility during SEM-EDX analysis: A challenge for characterizing epoxy/fluoropolymer interfaces

Vandi, Luigi-Jules, Truss, Rowan, Veidt, Martin, Rasch, Ronald, Heitzmann, Michael T. and Paton, Rowan (2013) Fluorine mobility during SEM-EDX analysis: A challenge for characterizing epoxy/fluoropolymer interfaces. Journal of Physical Chemistry C, 117 33: 16933-16941. doi:10.1021/jp403314t


Author Vandi, Luigi-Jules
Truss, Rowan
Veidt, Martin
Rasch, Ronald
Heitzmann, Michael T.
Paton, Rowan
Title Fluorine mobility during SEM-EDX analysis: A challenge for characterizing epoxy/fluoropolymer interfaces
Journal name Journal of Physical Chemistry C   Check publisher's open access policy
ISSN 1932-7447
1932-7455
Publication date 2013-08
Year available 2013
Sub-type Article (original research)
DOI 10.1021/jp403314t
Open Access Status
Volume 117
Issue 33
Start page 16933
End page 16941
Total pages 9
Place of publication Washington, DC, United States
Publisher American Chemical Society
Collection year 2014
Language eng
Abstract Precisely characterizing epoxy/thermoplastic interfaces on the nanometer scale using scanning electron microscopy energy-dispersive X-ray (EDX) represents a current challenge due to the large X-rays generation volume, specimen decomposition, and related phenomena occurring with polymer samples. Interface characterization is, however, of high interest because the adhesion strength and overall performance of composites depend on the interface region. This work investigates the interface between an aerospace-grade epoxy based on a tetraglycidyl diaminodiphenyl methane/diaminodiphenyl sulphone (TGDDM/DDS) formulation and a semicrystalline fluoropolymer. Monte Carlo simulation is used in combination with EDX spot analysis to evaluate the effect of X-ray generation volume, charging, and phenomena arising from specimen decomposition. The results indicate that fluorine mobility due to specimen damage by electron beam irradiation is the principal factor affecting interface width measurements. An effective solution achieved by optimizing acquisition parameters and using an electron thin specimen allows accurate interface width measurement with a resolution of <300 nm.
Keyword Scanning-Electron-Microscopy
Monte-Carlo Code
Thermoplastic Polymers
Polyvinylidene Fluoride
Matrix Composites
C-Language
Interphase
Epoxy
Diffusion
Casino
Q-Index Code C1
Q-Index Status Confirmed Code
Institutional Status UQ

 
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