Improved Method for Determining the Optical-Constants of Thin-Films and its Application to Molecular-Beam-Deposited Polycrystalline Layers

Meredith, P, Buller, GS and Walker, AC (1993) Improved Method for Determining the Optical-Constants of Thin-Films and its Application to Molecular-Beam-Deposited Polycrystalline Layers. Applied Optics, 32 28: 5619-5627.

Author Meredith, P
Buller, GS
Walker, AC
Title Improved Method for Determining the Optical-Constants of Thin-Films and its Application to Molecular-Beam-Deposited Polycrystalline Layers
Journal name Applied Optics   Check publisher's open access policy
ISSN 0003-6935
Publication date 1993-10
Sub-type Article (original research)
Volume 32
Issue 28
Start page 5619
End page 5627
Total pages 9
Language eng
Keyword Thin Films
Optical Constants
Spectroscopy
Molecular-Beam Deposition
Ultrahigh Vacuum
Polycrystalline Films
Interference Filters
Thickness
Q-Index Code C1
Q-Index Status Provisional Code
Institutional Status Unknown

Document type: Journal Article
Sub-type: Article (original research)
Collection: ResearcherID Downloads
 
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Citation counts: TR Web of Science Citation Count  Cited 17 times in Thomson Reuters Web of Science Article | Citations
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Created: Tue, 14 May 2013, 14:29:49 EST by System User