Grain boundary's conductivity in heavily yttrium doped ceria

Yan, P. F., Mori, T., Suzuki, A., Wu, Y. Y., Auchterlonie, G. J., Zou, J. and Drennan, J. (2012) Grain boundary's conductivity in heavily yttrium doped ceria. Solid State Ionics, 222-223 31-37. doi:10.1016/j.ssi.2012.06.026

Author Yan, P. F.
Mori, T.
Suzuki, A.
Wu, Y. Y.
Auchterlonie, G. J.
Zou, J.
Drennan, J.
Title Grain boundary's conductivity in heavily yttrium doped ceria
Journal name Solid State Ionics   Check publisher's open access policy
ISSN 0167-2738
Publication date 2012-08
Sub-type Article (original research)
DOI 10.1016/j.ssi.2012.06.026
Volume 222-223
Start page 31
End page 37
Total pages 7
Place of publication Amsterdam, Netherlands
Publisher Elsevier
Collection year 2013
Language eng
Formatted abstract
Four high purity heavily yttrium doped ceria (YDC, YxCe1 − xO2 − δ, x = 0.1, 0.15, 0.2 0.25) electrolytes were prepared and their grain boundaries (GBs) were investigated by impedance spectroscopy (IS) and transmission electron microscopy (TEM). IS data indicated that single GB's resistance and GB's thickness firstly decreased and then increased with increasing doping level. TEM investigation on GBs suggested the formation of nanodomains at GBs was responsible for the increase of GB's electrical thickness. Our work suggests in heavy doping level ceria, in addition to the space charge effect, nanodomain's blocking effect is another contribution to the high GB resistivity. According to the microstructure evolution of YDC with increasing doping level, we suggest three factors that influence nanodomain's segregation to GBs.
Keyword Grain boundary
Impedance spectroscopy
Doped ceria
Trivalent Cations
Temperature Sofc
Q-Index Code C1
Q-Index Status Confirmed Code
Institutional Status UQ

Version Filter Type
Citation counts: TR Web of Science Citation Count  Cited 11 times in Thomson Reuters Web of Science Article | Citations
Scopus Citation Count Cited 11 times in Scopus Article | Citations
Google Scholar Search Google Scholar
Created: Thu, 15 Nov 2012, 12:13:23 EST by System User on behalf of Centre for Microscopy and Microanalysis