Higher order versus second order statistics in ultrasound image deconvolution

Abeyratne, Udantha R., Petropulu, Athina P., Ried, John M., Golas, Thomas, Conant, Emily and Forsberg, Flemming (1997) Higher order versus second order statistics in ultrasound image deconvolution. IEEE Transactions On Ultrasonics Ferroelectrics and Frequency Control, 44 6: 1409-1416. doi:10.1109/58.656646


Author Abeyratne, Udantha R.
Petropulu, Athina P.
Ried, John M.
Golas, Thomas
Conant, Emily
Forsberg, Flemming
Title Higher order versus second order statistics in ultrasound image deconvolution
Journal name IEEE Transactions On Ultrasonics Ferroelectrics and Frequency Control   Check publisher's open access policy
ISSN 0885-3010
1525-8955
Publication date 1997-11-01
Sub-type Letter to editor, brief commentary or brief communication
DOI 10.1109/58.656646
Volume 44
Issue 6
Start page 1409
End page 1416
Total pages 8
Place of publication Piscataway, NJ, United States
Publisher Institute of Electrical and Electronics Engineers
Language eng
Abstract We recently proposed a method for the estimation of imaging distortions associated with ultrasound images, based on the higher-order statistics (HOS) of radio frequency data. In this correspondence, we utilize the HOS-based estimated distortions to deconvolve ultrasound images of the breast. We also estimate imaging distortions based on the second-order statistics (SOS) of radio frequency ultrasound data and subsequently utilize them to deconvolve the same breast images. Both subjective and objective measures suggest that deconvolution with HOS-based distortion estimates led to significantly higher resolution gains as compared to the gains achieved when SOS-based distortion estimates were used.
Q-Index Code C1
Q-Index Status Provisional Code
Institutional Status Non-UQ

Document type: Journal Article
Sub-type: Letter to editor, brief commentary or brief communication
Collection: School of Information Technology and Electrical Engineering Publications
 
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Created: Wed, 14 Nov 2012, 22:59:05 EST by Dr Udantha Abeyratne on behalf of School of Information Technol and Elec Engineering