A novel way to distinguish single phase dips through potential gradient method

Thakur, P., Singh, A. K. and Bansal, R. C. (2012) A novel way to distinguish single phase dips through potential gradient method. Electric Power Components and Systems, 40 3: 336-347. doi:10.1080/15325008.2011.631082


Author Thakur, P.
Singh, A. K.
Bansal, R. C.
Title A novel way to distinguish single phase dips through potential gradient method
Journal name Electric Power Components and Systems   Check publisher's open access policy
ISSN 1532-5008
1532-5016
Publication date 2012
Sub-type Critical review of research, literature review, critical commentary
DOI 10.1080/15325008.2011.631082
Volume 40
Issue 3
Start page 336
End page 347
Total pages 12
Place of publication Philadelphia, PA, United States
Publisher Taylor & Francis
Collection year 2013
Language eng
Abstract The majority of faults on a utility system are line-to-ground faults, and it is also the most common cause of voltage dips in industrial system. The disruption of an industrial process due to a line-to-ground fault can result in substantial costs to operation. The dip in the single phase associated with this fault is either type B or D. However, type D is also associated with to line-to-line faults. For the application of a suitable mitigation scheme to voltage dips, it is essential to distinguish between type B and D from measured sag voltages. This article discusses the characteristics of dips associated with line-to-ground and line-to-line faults and presents a new method to detect type B and D with the help of positive- and negative-sequence potential gradient methods derived as a function of distance to fault location. The need to distinguish type B and D, and the advantages of characterization through the sequence component, are also discussed.
Keyword Power quality
Potential gradient
Symmetrical component
Voltage dips
Q-Index Code C1
Q-Index Status Confirmed Code
Institutional Status UQ

Document type: Journal Article
Sub-type: Critical review of research, literature review, critical commentary
Collections: Official 2013 Collection
School of Information Technology and Electrical Engineering Publications
 
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