Nanomaterial engineering and property studies in a transmission electron microscope

Golberg, Dmitri, Costa, Pedro M. F. J., Wang, Ming-Sheng, Wei, Xianlong, Tang, Dai-Ming, Xu, Zhi, Huang, Yang, Gautam, Ujjal K., Liu, Baodan, Zeng, Haibo, Kawamoto, Naoyki, Zhi, Chunyi, Mitome, Masanori and Bando, Yoshio (2012) Nanomaterial engineering and property studies in a transmission electron microscope. Advanced Materials, 24 2: 177-194. doi:10.1002/adma.201102579

Author Golberg, Dmitri
Costa, Pedro M. F. J.
Wang, Ming-Sheng
Wei, Xianlong
Tang, Dai-Ming
Xu, Zhi
Huang, Yang
Gautam, Ujjal K.
Liu, Baodan
Zeng, Haibo
Kawamoto, Naoyki
Zhi, Chunyi
Mitome, Masanori
Bando, Yoshio
Title Nanomaterial engineering and property studies in a transmission electron microscope
Journal name Advanced Materials   Check publisher's open access policy
ISSN 0935-9648
Publication date 2012-01-10
Year available 2011
Sub-type Article (original research)
DOI 10.1002/adma.201102579
Volume 24
Issue 2
Start page 177
End page 194
Total pages 18
Editor Masakazu Aono
Yoshio Bando
Katsuhiko Ariga
Heinrich Rohrer
Harold Kroto
Place of publication Weinheim, Germany
Publisher Wiley - VCH Verlag
Collection year 2012
Language eng
Abstract Modern methods of in situ transmission electron microscopy (TEM) allow one to not only manipulate with a nanoscale object at the nanometer-range precision but also to get deep insights into its physical and chemical statuses. Dedicated TEM holders combining the capabilities of a conventional high-resolution TEM instrument and atomic force -, and/or scanning tunneling microscopy probes become the powerful tools in nanomaterials analysis. This progress report highlights the past, present and future of these exciting methods based on the extensive authors endeavors over the last five years. The objects of interest are diverse. They include carbon, boron nitride and other inorganic one- and two-dimensional nanoscale materials, e.g., nanotubes, nanowires and nanosheets. The key point of all experiments discussed is that the mechanical and electrical transport data are acquired on an individual nanostructure level under ultimately high spatial, temporal and energy resolution achievable in TEM, and thus can directly be linked to morphological, structural and chemical peculiarities of a given nanomaterial.
Keyword Transmission electron microscopy
Q-Index Code CX
Q-Index Status Confirmed Code
Institutional Status UQ
Additional Notes Article first published online: 14 OCT 2011. Special Issue: WPI Research Center for Materials Nanoarchitectonics, NIMS.

Document type: Journal Article
Sub-type: Article (original research)
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