Characterization, cathodolutumescence, and fieldemission properties of morphology-tunable CdS micro/nanostructures

Zhai, Tianyou, Fang, Xiaosheng, Bando, Yoshio, Dierre, Benjamin, Liu, Baodan, Zeng, Haibo, Xu, Xijin, Huang, Yang, Yuan, Xiaoli, Sekiguchi, Takashi and Golberg, Dmitri (2009) Characterization, cathodolutumescence, and fieldemission properties of morphology-tunable CdS micro/nanostructures. Advanced Functional Materials, 19 15: 2423-2430. doi:10.1002/adfm.200900295

Author Zhai, Tianyou
Fang, Xiaosheng
Bando, Yoshio
Dierre, Benjamin
Liu, Baodan
Zeng, Haibo
Xu, Xijin
Huang, Yang
Yuan, Xiaoli
Sekiguchi, Takashi
Golberg, Dmitri
Title Characterization, cathodolutumescence, and fieldemission properties of morphology-tunable CdS micro/nanostructures
Journal name Advanced Functional Materials   Check publisher's open access policy
ISSN 1616-301X
Publication date 2009-08-10
Sub-type Article (original research)
DOI 10.1002/adfm.200900295
Volume 19
Issue 15
Start page 2423
End page 2430
Total pages 8
Place of publication Weinheim, Germany
Publisher Wiley - VCH Verlag
Language eng
Formatted abstract
High-quality, uniform one-dimensional CdS micro/nanostructures with different morphologies—microrods, sub-microwires and nanotips—are fabricated through an easy and effective thermal evaporation process. Their structural, cathodoluminescence and field-emission properties are systematically investigated. Microrods and nanotips exhibit sharp near-band-edge emission and broad deep-level emission, whereas sub-microwires show only the deep-level emission. A significant decrease in a deep-level/near-band-edge intensity ratio is observed along a tapered nanotip towards a smaller diameter part. This behavior is understood by consideration of defect concentrations in the nanotips, as analyzed with high-resolution transmission electron microscopy. Field-emission measurements show that the nanotips possess the best field-emission characteristics among all 1D CdS nanostructures reported to date, with a relatively low turn-on field of 5.28 V µm−1 and the highest field-enhancement factor of 4 819. The field-enhancement factor, turn-on and threshold fields are discussed related to structure morphology and vacuum gap variations under emission.
Keyword Cadmium sulfide
Q-Index Code C1
Q-Index Status Provisional Code
Institutional Status Non-UQ

Document type: Journal Article
Sub-type: Article (original research)
Collections: School of Mechanical & Mining Engineering Publications
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