Defect engineering in self-assembled 3D photonic crystals

Yan, Qingfeng, Zhou, Zuocheng, Su, Fabing and Zhao, X. S. (2007). Defect engineering in self-assembled 3D photonic crystals. In: China International Conference on Nanoscience and Technology, ChinaNANO 2005, Beijing, People's Republic of China, (57-60). 9-11 June 2005. doi:10.4028/www.scientific.net/SSP.121-123.57


Author Yan, Qingfeng
Zhou, Zuocheng
Su, Fabing
Zhao, X. S.
Title of paper Defect engineering in self-assembled 3D photonic crystals
Conference name China International Conference on Nanoscience and Technology, ChinaNANO 2005
Conference location Beijing, People's Republic of China
Conference dates 9-11 June 2005
Journal name Solid State Phenomena   Check publisher's open access policy
Place of Publication Enfield, NH, United States
Publisher Trans Tech
Publication Year 2007
Sub-type Fully published paper
DOI 10.4028/www.scientific.net/SSP.121-123.57
ISBN 3908451302
9783908451303
ISSN 1012-0394
Volume 121-123
Start page 57
End page 60
Total pages 4
Language eng
Abstract/Summary This work describes the combination of photolithography and self-assembly methods for fabrication of 3D photonic crystals (PCs) with well-defined micron-scale line defects embedded in the PCs. Line defects with different dimensions, shapes, and compositions have been introduced into the 3D PCs by choosing different photoresists, masks, and template-directed assembly techniques. Infiltration of carbon using high-temperature chemical vapour deposition (CVD) technique showed that the fabrication procedure offers an ideal approach to functional 3D photonic devices from self-assembled photonic crystals.
Keyword Photonic crystal
Colloidal crystal
Self-assembly
Line defect
Q-Index Code E1
Q-Index Status Provisional Code
Institutional Status Non-UQ

Document type: Conference Paper
Collections: School of Chemical Engineering Publications
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