Nanogrinding of multi-layered thin film amorphous Si solar panels

Sumitomo, Taro, Huang, Han, Zhou, Libo and Shimizu, Jun (2011) Nanogrinding of multi-layered thin film amorphous Si solar panels. International Journal of Machine Tools and Manufacture, 51 10-11: 797-805. doi:10.1016/j.ijmachtools.2011.07.001


Author Sumitomo, Taro
Huang, Han
Zhou, Libo
Shimizu, Jun
Title Nanogrinding of multi-layered thin film amorphous Si solar panels
Journal name International Journal of Machine Tools and Manufacture   Check publisher's open access policy
ISSN 0890-6955
1879-2170
Publication date 2011-10
Sub-type Article (original research)
DOI 10.1016/j.ijmachtools.2011.07.001
Volume 51
Issue 10-11
Start page 797
End page 805
Total pages 9
Place of publication New York, NY, U.S.A.
Publisher Elsevier
Collection year 2012
Language eng
Formatted abstract
Nanogrinding was performed on the cross-sections of amorphous Si thin film solar panels, which are nanoscale multi-layer structures consisting of hard and brittle materials. The deformed structures of the panel cross-sectional surfaces after grinding were investigated using electron and atomic force microscopy. The nanogrinding results were compared with those obtained from polishing and nanoscratching, demonstrating that the three processes had produced consistent surface characteristics. Though nanogrinding produced nanometric surface roughness with ductile material removal, but could cause cracking, edge chipping and delamination at thin film interfaces. The results of this work are of value for developing the efficient machining process for thin film solar panels and other brittle multi-layer materials.

Highlights: ► Nanogrinding of multi-layered solar panels enabled a minimal damage to interfaces. ► Single-point nanoscratching well presented the multi-point grinding process. ► Nanogrinding was viable for machining multi-layered thin film nanostructures.
Keyword Nanogrinding
Solar panel
Multi-layer
Deformation
Material removal
Brittle materials
Mechanical-properties
Ductile-regime
Silicon
Point
Technology
Q-Index Code C1
Q-Index Status Confirmed Code
Institutional Status UQ
Additional Notes Publication date: October-November 2011

Document type: Journal Article
Sub-type: Article (original research)
Collections: School of Mechanical & Mining Engineering Publications
Official 2012 Collection
 
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