Molecular-resolved imaging of the Hierarchical Self-Assembly of a conductive polymer at single-walled carbon nanotube interfaces

Bell, John M., Goh, Roland G. S., Motta, Nunzio, Musumeci, Anthony and Waclawik, Eric R. (2006). Molecular-resolved imaging of the Hierarchical Self-Assembly of a conductive polymer at single-walled carbon nanotube interfaces. In: Proceedings of the International Conference On Nanoscience and Nanotechnology 2006. ICONN '06. International Conference on Nanoscience and Nanotechnology 2006, Brisbane, Australia, (312-315). 3-7 July 2006. doi:10.1109/ICONN.2006.340692


Author Bell, John M.
Goh, Roland G. S.
Motta, Nunzio
Musumeci, Anthony
Waclawik, Eric R.
Title of paper Molecular-resolved imaging of the Hierarchical Self-Assembly of a conductive polymer at single-walled carbon nanotube interfaces
Conference name ICONN '06. International Conference on Nanoscience and Nanotechnology 2006
Conference location Brisbane, Australia
Conference dates 3-7 July 2006
Proceedings title Proceedings of the International Conference On Nanoscience and Nanotechnology 2006
Journal name 2006 International Conference On Nanoscience and Nanotechnology, Vols 1 and 2
Place of Publication Piscatawa, NJ, United States
Publisher IEEE
Publication Year 2006
Sub-type Fully published paper
DOI 10.1109/ICONN.2006.340692
ISBN 9781424404520
1424404525
Volume 1-2
Start page 312
End page 315
Total pages 4
Language eng
Abstract/Summary Molecular-resolved real-space images of selfassembled structures of the conductive polymer regioregular poly(3-hexylthiophene) (rrP3HT) on single-walled carbon nanotube (SWNT) substrates were obtained using scanning tunneling microscopy (STM). The STM images revealed that the adsorbed polymer formed a 10 nm thick coating on some SWNT's in agreement with previous transmission electron microscopy results. This thickness corresponds to a coating of similar to 25 layers of polymer on SWNT, assuming that pi-pi interactions between rrP3HT layers and the underlying SWNT directs the polymer self-assembly process. The polymer backbone inter-chain spacing (d(cc) = 1.55 nm) of the outermost layer of adsorbed rrP3HT is approximately 7% larger than is observed for rrP3HT adsorbed on HOPG (d(cc) = 1.45 nm). The polymer also wraps around the SWNT at an angle with respect to the SWNT long-axis, which indicates that rrP3HT self-assembly is hierarchical. The conductive polymer's deposition occurs with epitaxy and is directed by the underlying SWNT chiral structure.
Keyword Conjugated Polymer
Microscopy
Composite
Mechanism
Mobility
Q-Index Code E1
Q-Index Status Provisional Code
Institutional Status UQ
Additional Notes Article number 4143472, Pages 610-613

 
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