Microstructures of YBa1.85Eu0.15Cu3O7-delta superconducting films grown on SrTiO3 and YSZ substrates

Xie, Qiyun, Gu, Mingqiang, Qian, Bin, Wu, Xiaoshan, Jiang, Zhengsheng, Zou, Jin and Gao, Ju (2011). Microstructures of YBa1.85Eu0.15Cu3O7-delta superconducting films grown on SrTiO3 and YSZ substrates. In: Chuangtian Chen, Thomas F. Kuech, Tatau Nishinaga and Lili Zheng, The combined proceedings of the ICCG16/ICVGE14. 16th International Conference on Crystal Growth (ICCG16)/14th International Conference on Vapor Growth and Epitaxy (ICVGE14), Beijing, China, (580-585). 8-13 August 2010. doi:10.1016/j.jcrysgro.2010.09.060


Author Xie, Qiyun
Gu, Mingqiang
Qian, Bin
Wu, Xiaoshan
Jiang, Zhengsheng
Zou, Jin
Gao, Ju
Title of paper Microstructures of YBa1.85Eu0.15Cu3O7-delta superconducting films grown on SrTiO3 and YSZ substrates
Formatted title
Microstructures of YBa1.85Eu0.15Cu3O 7-δ superconducting films grown on SrTiO3 and YSZ substrates
Conference name 16th International Conference on Crystal Growth (ICCG16)/14th International Conference on Vapor Growth and Epitaxy (ICVGE14)
Conference location Beijing, China
Conference dates 8-13 August 2010
Proceedings title The combined proceedings of the ICCG16/ICVGE14   Check publisher's open access policy
Journal name Journal of Crystal Growth   Check publisher's open access policy
Place of Publication Amsterdam, Netherlands
Publisher Elsevier BV
Publication Year 2011
Year available 2010
Sub-type Fully published paper
DOI 10.1016/j.jcrysgro.2010.09.060
ISSN 0022-0248
1873-5002
Editor Chuangtian Chen
Thomas F. Kuech
Tatau Nishinaga
Lili Zheng
Volume 318
Issue 1
Start page 580
End page 585
Total pages 6
Collection year 2012
Language eng
Formatted Abstract/Summary
A detailed atomic scale microstructure analysis of Eu-doped YBa1.85Eu0.15Cu3O7−δ (YEBCO) thin films with 100 nm in thickness has been carried out by a combination of scanning electron microscopy (SEM) and transmission electron microscopy (TEM). Interesting regular-like arranged network of nanoscale undulations is observed on the surface of YEBCO film on (0 0 1) SrTiO3 substrate. TEM image clearly indicates that the film is always c-axis oriented, but lots of natural precipitates of Y2O3 are involved both at the interface and deep in the film. Desirable size and number density of Y2O3 are thought to be important for acting as efficient flux pinning centers. In the case of YEBCO film on (0 0 1) yttrium stabilized ZrO2 (YSZ) substrate, few cracks and outgrowths appear due to much larger lattice mismatch and dissimilar crystal structure between the film and substrate, but surface quality is still much better compared to the parent YBaCu3O7−δ film. Besides, highly textured BaZrO3 layer at the interface and a-axis grains with small dimensions in the film are formed. Interface stability of two kinds of films studied, namely YEBCO/STO and YEBCO/YSZ, is also assessed comprehensively by first principle calculations.
Keyword Surface structure
Transmission electron microscopy
Defects
Cuprates
Q-Index Code C1
Q-Index Status Confirmed Code
Institutional Status UQ
Additional Notes Available online 25 September 2010

 
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