Sensitive and direct detection using rupture event scanning (REVS (TM))

Kelling, S, Cooper, MA, Stirrups, K, Karamanska, R, Ostanin, VP, Klenerman, D, Slepstov, A, Rehak, M, Dultsev, FN, Minson, T and Abell, C (2002). Sensitive and direct detection using rupture event scanning (REVS (TM)). In: Proceedings of the 2002 Ieee International Frequency Control Symposium & Pda Exhibition. IEEE International Frequency Control Symposium and PDA Exhibition, New Orleans La, (756-760). May 29-31, 2002. doi:10.1109/FREQ.2002.1075982


Author Kelling, S
Cooper, MA
Stirrups, K
Karamanska, R
Ostanin, VP
Klenerman, D
Slepstov, A
Rehak, M
Dultsev, FN
Minson, T
Abell, C
Title of paper Sensitive and direct detection using rupture event scanning (REVS (TM))
Conference name IEEE International Frequency Control Symposium and PDA Exhibition
Conference location New Orleans La
Conference dates May 29-31, 2002
Proceedings title Proceedings of the 2002 Ieee International Frequency Control Symposium & Pda Exhibition
Journal name Proceedings of the 2002 Ieee International Frequency Control Symposium
Publication Year 2002
Sub-type Fully published paper
DOI 10.1109/FREQ.2002.1075982
ISBN 0-7803-7082-1
ISSN 1075-6787
Start page 756
End page 760
Total pages 5
Language eng
Keyword biosensor
Qcm
Qcr
quartz crystal
acoustic detection
virus
bacteria
Dna
protein
drug
Quartz-Crystal Microbalance
Biosensors
Q-Index Code E1
Q-Index Status Provisional Code
Institutional Status Unknown

Document type: Conference Paper
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Created: Thu, 18 Aug 2011, 09:10:43 EST by System User