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Integration and analysis of optical and SEM-based microscopy for automated mineralogical characterisation
Hartner, Richard, Walters, Steve G. and Berry, Ron (2011). Integration and analysis of optical and SEM-based microscopy for automated mineralogical characterisation. In: Maarten A.T.M. Broekmans, 10th lCAM Proceedings. 10th International Congress for Applied Mineralogy, Trondheim, Noway, (319-326). 1-5 August 2011.
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UQ245630_fulltext.pdf
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UQ245630_other.pdf
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