A CMOS relative ultrasound energy measurement circuit with temperature compensation

Lu, Chengbin and Postula, Adam (2010). A CMOS relative ultrasound energy measurement circuit with temperature compensation. In: , 2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings. International Instrumentation and Measurement Technology Conference (I2MTC), Austin, TX, U.S.A., (5488074-1274-5488074-1277). 3-6 May 2010.

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Author Lu, Chengbin
Postula, Adam
Title of paper A CMOS relative ultrasound energy measurement circuit with temperature compensation
Conference Paper Type Fully Published Paper
Conference name International Instrumentation and Measurement Technology Conference (I2MTC)
DOI 10.1109/IMTC.2010.5488074
Conference location Austin, TX, U.S.A.
Conference dates 3-6 May 2010
Proceedings title 2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings   Check publisher's open access policy
Journal name IEEE Instrumentation and Measurement Technology Conference. Proceedings   Check publisher's open access policy
Place published Piscataway, NJ, U.S.A.
Publisher I E E E
Publication date 2010
Year available 2010
ISBN 9781424428328
ISSN 1091-5281
Start page 5488074-1274
End page 5488074-1277
Total pages 4
Collection year 2011
Language eng
Abstract/Summary CMOS temperature compensated circuit used in measuring relative ultrasound energy is presented in this paper. The core of the circuit is a temperature compensated voltage to current squarer (VCSQ) and a current integrator. The VCSQ consists of a Linear-Transconductor(LTC) and a current-mode squarer. A current source (dependent on MOS transconductance which is in turn dependent on absolute temperature) is used to bias the current-mode squarer; this provides temperature compensation of the circuit. The circuit is simulated for AMI05 (0.5um) technology using Eldo in Mentor Graphics environment. With the compensation, the VCSQ output drift with temperature is achieved better than 1.98% in the 10~90°C range for ±1.2V input range. The integrator output drift is achieved for full scale error better than 2.5% in the 10-90°C range, 1.6% in the 30~90°C range. © Copyright 2011 IEEE – All Rights Reserved
Keyword CMOS
Squarer
Temperature compensation
Ultrasound
Q-Index Code E1
Q-Index Status Confirmed Code
Institutional Status UQ
Additional Notes Presented in session 4B2 : Temperature Measurements

Document type: Conference Paper
Sub-type: Fully Published Paper
Collections: Official 2011 Collection
School of Information Technology and Electrical Engineering Publications
 
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