Analysis of nanometer displacement measurement using the self-mixing technique based on VCSEL

Bakar, A. A. A., Bertling, K., Kliese, R., Lim, Y. L. and Rakic, A. D. (2010). Analysis of nanometer displacement measurement using the self-mixing technique based on VCSEL. In: Andrew Dzurak, Proceedings of ICONN 2010. 2010 International Conference On Nanoscience and Nanotechnology (ICONN), Sydney, NSW, Australia, (). 22-26 February 2010.


Author Bakar, A. A. A.
Bertling, K.
Kliese, R.
Lim, Y. L.
Rakic, A. D.
Title of paper Analysis of nanometer displacement measurement using the self-mixing technique based on VCSEL
Conference name 2010 International Conference On Nanoscience and Nanotechnology (ICONN)
Conference location Sydney, NSW, Australia
Conference dates 22-26 February 2010
Proceedings title Proceedings of ICONN 2010
Place of Publication Piscataway, NJ, United States
Publisher IEEE (Institute for Electrical and Electronic Engineers)
Publication Year 2010
Sub-type Oral presentation
DOI 10.1109/ICONN.2010.6045269
ISBN 9781424452620
9781424452613
Editor Andrew Dzurak
Language eng
Q-Index Code EX
Q-Index Status Provisional Code
Institutional Status Unknown
Additional Notes Presented at Symposium 5: Nanophotonics

 
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Created: Tue, 01 Mar 2011, 23:26:53 EST by Yah Leng Lim on behalf of School of Information Technol and Elec Engineering