Test generation with context free grammars and covering arrays

Hoffman, Daniel, Sobotkiewicz, Lewis, Wang, Hong-Yi, Strooper, Paul, Bazdell, Gary and Stevens, Brett (2009). Test generation with context free grammars and covering arrays. In: Gregory Kapfhammer and Neil Walkinshaw, Testing: Academic & Industrial Conference - Practice and Research Techniques. TAIC PART, Testing: Academic & Industrial Conference - Practice and Research Techniques, Windsor, United Kingdom, (43-47). 4-6 September 2009. doi:10.1109/TAICPART.2009.35


Author Hoffman, Daniel
Sobotkiewicz, Lewis
Wang, Hong-Yi
Strooper, Paul
Bazdell, Gary
Stevens, Brett
Title of paper Test generation with context free grammars and covering arrays
Conference name TAIC PART, Testing: Academic & Industrial Conference - Practice and Research Techniques
Conference location Windsor, United Kingdom
Conference dates 4-6 September 2009
Proceedings title Testing: Academic & Industrial Conference - Practice and Research Techniques
Journal name TAIC PART 2009 - Testing: Academic and Industrial Conference - Practice and Research Techniques
Place of Publication USA
Publisher IEEE Computer Society
Publication Year 2009
Year available 2009
Sub-type Fully published paper
DOI 10.1109/TAICPART.2009.35
ISBN 978-0-7695-3820-4
Editor Gregory Kapfhammer
Neil Walkinshaw
Start page 43
End page 47
Total pages 5
Collection year 2010
Language eng
Subjects 080309 Software Engineering
890299 Computer Software and Services not elsewhere classified
E1
Q-Index Code E1
Q-Index Status Confirmed Code

 
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Created: Mon, 19 Apr 2010, 12:21:49 EST by Marie Walker on behalf of School of Information Technol and Elec Engineering