Compute Inclusion Depth of a Pattern

Luo, Wei (2005). Compute Inclusion Depth of a Pattern. In: Lecture Notes in computer Science - Learning Theory: 18th Annual Conference on Learning Theory (COLT 2005). 18th Annual Conference on Learning Theory (COLT 2005), Bertinoro, Italy, (689-690). 27-30 June 2005. doi:10.1007/11503415_48


Author Luo, Wei
Title of paper Compute Inclusion Depth of a Pattern
Conference name 18th Annual Conference on Learning Theory (COLT 2005)
Conference location Bertinoro, Italy
Conference dates 27-30 June 2005
Proceedings title Lecture Notes in computer Science - Learning Theory: 18th Annual Conference on Learning Theory (COLT 2005)   Check publisher's open access policy
Journal name Learning Theory, Proceedings   Check publisher's open access policy
Place of Publication Berlin ; New York
Publisher Springer
Publication Year 2005
Sub-type Fully published paper
DOI 10.1007/11503415_48
ISBN 3540265562
ISSN 0302-9743
1611-3349
Volume 3559
Start page 689
End page 690
Total pages 2
Language eng
Subjects 1702 Cognitive Sciences
Q-Index Code E1

 
Versions
Version Filter Type
Citation counts: TR Web of Science Citation Count  Cited 3 times in Thomson Reuters Web of Science Article | Citations
Scopus Citation Count Cited 0 times in Scopus Article
Google Scholar Search Google Scholar
Created: Mon, 08 Mar 2010, 14:37:25 EST by Thelma Whitbourne on behalf of Faculty Of Engineering, Architecture & Info Tech