Noise and charge transport in polymer thin-film structures

Marinov, O., Deen, M. J., Yu, J., Vamvounis, G., Holdcroft, S. and Woods, W. (2003). Noise and charge transport in polymer thin-film structures. In: Noise in Devices and Circuits. 1st International Symposium on Fluctuations and Noise, Santa Fe, U.S., (301-312). 1-4 June, 2003. doi:10.1117/12.485990

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Author Marinov, O.
Deen, M. J.
Yu, J.
Vamvounis, G.
Holdcroft, S.
Woods, W.
Title of paper Noise and charge transport in polymer thin-film structures
Conference name 1st International Symposium on Fluctuations and Noise
Conference location Santa Fe, U.S.
Conference dates 1-4 June, 2003
Proceedings title Noise in Devices and Circuits   Check publisher's open access policy
Journal name Noise in Devices and Circuits   Check publisher's open access policy
Place of Publication Bellingham, U.S.
Publisher International Society for Optical Engineering
Publication Year 2003
Sub-type Fully published paper
DOI 10.1117/12.485990
Open Access Status File (Publisher version)
ISBN 0-8194-4973-3
ISSN 0277-786X
Volume 5113
Start page 301
End page 312
Total pages 12
Language eng
Abstract/Summary The low frequency noise (LFN) properties of. the field-effect transistors (FETs) using polymers as the semiconducting material in thin-film transistor (TFT) structures are investigated and discussed in terms of the charge carrier transport. Results obtained from several research groups are summarized. Injection-drift limited model (IDLM) for charge transport in amorphous PFETs is discussed. IDLM has some advantages in comparison to the commonly used metal-oxide-semiconductor (MOS) transistor models. A general trend of proportionality between noise power density and the DC power applied to the polymer FET's (PFET's), channel is observed in the data from several research groups. This trend implies mobility fluctuation in PFET as the dominant noise source.
Subjects 0913 Mechanical Engineering
Keyword Organic Field-Effect Transistors
Polymer TFT
Low-Frequency Noise and Fluctuation
Charge Transport
Injection-Drift-Limited Model
Charge Hopping
Mobility Noise
Q-Index Code E1
Q-Index Status Provisional Code
Institutional Status Unknown
Additional Notes Book Series: Proceedings of the Society of Photo-Optical Instrumentation Engineers. Copyright 2003 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

 
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Created: Mon, 01 Feb 2010, 15:21:24 EST by Tara Johnson on behalf of Faculty of Science