The measurement of subtle structural changes in YBa2Cu3O7-x by processing high resolution TEM images

Barry, J. C. and Alarco, J. A. (1999). The measurement of subtle structural changes in YBa2Cu3O7-x by processing high resolution TEM images. In: Microscopy and Microanalysis 5, Proceedings of Microscopy and Microanalysis 1999. Microscopy and Microanalysis 1999, Portland, Oregon, (196-197). 1-5 August 1999.

Author Barry, J. C.
Alarco, J. A.
Title of paper The measurement of subtle structural changes in YBa2Cu3O7-x by processing high resolution TEM images
Conference name Microscopy and Microanalysis 1999
Conference location Portland, Oregon
Conference dates 1-5 August 1999
Proceedings title Microscopy and Microanalysis 5, Proceedings of Microscopy and Microanalysis 1999   Check publisher's open access policy
Publisher Microscopy Society of America
Publication Year 1999
Sub-type Fully published paper
ISSN 1431-9276
Volume 5
Issue 2
Start page 196
End page 197
Total pages 2
Collection year 1999
Language eng
Subjects E3
250199 Physical Chemistry not elsewhere classified
780102 Physical sciences
Q-Index Code E3

Document type: Conference Paper
Collection: School of Physical Sciences Publications
 
Versions
Version Filter Type
Citation counts: Google Scholar Search Google Scholar
Created: Fri, 06 Jun 2008, 15:28:57 EST