A critical comparison of high-speed VCSEL characterization techniques

O'Brien, C.J., Majewski, M.L. and Rakic, A.D. (2007) A critical comparison of high-speed VCSEL characterization techniques. Journal of Lightwave Technology, 25 2: 597-605. doi:10.1109/JLT.2006.889362


Author O'Brien, C.J.
Majewski, M.L.
Rakic, A.D.
Title A critical comparison of high-speed VCSEL characterization techniques
Journal name Journal of Lightwave Technology   Check publisher's open access policy
ISSN 0733-8724
Publication date 2007
Sub-type Article (original research)
DOI 10.1109/JLT.2006.889362
Volume 25
Issue 2
Start page 597
End page 605
Total pages 9
Editor Willner, A.E.
Place of publication Piscataway
Publisher IEEE-inst Electrical Electronics Engineers Inc
Collection year 2008
Language eng
Subject 291702 Optical and Photonic Systems
700399 Communication services not elsewhere classified
C1
Abstract This paper critically compares, for the first time, common microwave and optical procedures used for the highspeed characterization of vertical-cavity surface-emitting lasers (VCSELs). The intrinsic small-signal modulation characteristics of a VCSEL are measured, and the related rate equation parameters are extracted. Observed trends show excellent agreement with theory. The modulation characteristics of the VCSEL are determined by examining three different responses: relative intensity noise, S21 response, and high-resolution optical spectra. The various experimental techniques yielded consistent results. The relative strengths and weaknesses of each measurement are investigated.
Keyword Engineering, Electrical & Electronic
Optics
relative intensity noise (RIN)
relaxation resonance frequency
vertical-cavity surface-emitting laser (VCSEL)
Surface-emitting Lasers
Relative Intensity Noise
Semiconductor-lasers
Phase Noise
Optical Feedback
Relaxation Resonance
Frequency-response
Field Spectrum
Arrays
Modulation
Q-Index Code C1
Q-Index Status Confirmed Code

 
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Created: Mon, 18 Feb 2008, 16:50:00 EST