A mechanism for the poisoning effect of silicon on the grain refinement of Al-Si alloys

Qiu, D., Taylor, J. A., Zhang, M.-X. and Kelly, P. M. (2007) A mechanism for the poisoning effect of silicon on the grain refinement of Al-Si alloys. Acta Materialia, 55 4: 1447-1456.

Author Qiu, D.
Taylor, J. A.
Zhang, M.-X.
Kelly, P. M.
Title A mechanism for the poisoning effect of silicon on the grain refinement of Al-Si alloys
Journal name Acta Materialia   Check publisher's open access policy
ISSN 1359-6454
Publication date 2007
Year available 2007
Sub-type Article (original research)
DOI 10.1016/j.actamat.2006.09.046
Volume 55
Issue 4
Start page 1447
End page 1456
Total pages 10
Editor Mahajan, S.
Place of publication Oxford
Publisher Pergamon-elsevier Science Ltd
Collection year 2008
Language eng
Subject 291403 Alloy Materials
670802 Aluminium
Abstract The poisoning effect of excess Si solute on the grain-refining potency of Al-Ti-B grain refiners in Al-Si casting alloys has been studied in a crystallographic investigation. The edge-to-edge matching model was used for investigating and comparing the possible poisoning effects of several binary and ternary intermetallic compounds containing Si and Ti. The results show that the poisoning effect is probably due to the formation of a Ti5Si3 coating on the surface of TiAl3, because the Ti5Si3 phase has a much better crystallographic matching with TiAl3 than it does with the Al matrix. However, TiB2 particles appear to survive because an excessively large misfit prevents the Ti5Si3 phase from forming on the surface of TiB2. The implications of this proposed mechanism are discussed in the light of current practical casting solutions and the continuing debate on the grain refinement mechanism. (c) 2006 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
Keyword Materials Science, Multidisciplinary
Metallurgy & Metallurgical Engineering
aluminium alloys
grain refining
edge-to-edge matching
Edge Matching Model
Orientation Relationships
Heterogeneous Nucleation
Part Ii
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Created: Mon, 18 Feb 2008, 16:26:33 EST