Evaluation of hot-carrier induced degradation in MOSFETs by measurement at cryogenic temperatures

Yao, Sherry Shu-Ting (2000). Evaluation of hot-carrier induced degradation in MOSFETs by measurement at cryogenic temperatures Master's Thesis, School of Computer Science and Electrical Engineering, The University of Queensland.

Author Yao, Sherry Shu-Ting
Thesis Title Evaluation of hot-carrier induced degradation in MOSFETs by measurement at cryogenic temperatures
School, Centre or Institute School of Computer Science and Electrical Engineering
Institution The University of Queensland
Publication date 2000
Thesis type Master's Thesis
Supervisor Y. Yeow
Total pages 100
Collection year 2001
Language eng
Subjects L
299999 Engineering and Technology not elsewhere classified
660300 Energy Storage and Distribution

Document type: Thesis
Collection: UQ Theses - Citation only
 
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Created: Fri, 24 Aug 2007, 17:39:59 EST