Browse By Depositor - David Hong

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 Browse By Depositor - David Hong:
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Hong, Yang David, Yeow, YewTong, Chim, Wai Kin, Yan, Jian and Wong, Kin Mun (2006) Accurate Modeling of the Effects of Fringing Area Interface Traps on Scanning Capacitance Microscopy Measurement. IEEE Transactions on Electron Devices, 53 3: 499-506. doi:10.1109/TED.2005.864367 432 198 1 Cited 1 times in Scopus1 0
Hong, Y. D., Yan, J., Wong, K. M., Yeow, Y. T. and Chim, W. K. (2004). Dopant Profile Extraction by Inverse Modeling of Scanning Capacitance Microscopy Using Peak dC/dV. In: 7th International Conference on Solid-State and Integrated Circuits Technology (ICSICT), Beijing, China, (954-957). 18-21 October, 2004. 205 679 0
Hong, Yang David, Yeow, Yew Tong, Chim, Wai-Kin, Wong, Kin-Mun and Kopanski, Joseph J. (2004) Influence of Interface Traps and Surface Mobility Degradation on Scanning Capacitance Microscopy Measurement. IEEE Transactions on Electron Devices, 51 9: 1496-1503. doi:10.1109/ted.2004.833590 310 290 7 Cited 8 times in Scopus8 0
Hong, Y. D. and Yeow, Y. T. (2003). Modeling Mobility Degradation in Scanning Capacitance Microscopy for Semiconductor Dopant Profile Measurement. In: Chiao, Jung-Chih, Hariz, Alex J., Jamieson, David N., Parish, Giacinta and Varadan, Vijay K., SPIE International Symposium on Microelectronics, MEMS, and Nanotechnology, Perth, Australia, (548-555). 9-12 December, 2003. 309 729
Hong, Y. D. and Yeow, Y. T. (2004). Modeling the Effects of Interface Traps on Scanning Capacitance Microscopy dC/dV Measurement. In: Rakic, Aleksandr D. and Yeow, Yew Tong, Conference on Optoelectronics and Microelectronic Materials and Devices (COMMAD), Brisbane, Australia, (). 8-10 December, 2004. 215 332
Chim, W. K., Wong, K. M., Yeow, Y. T., Hong, Y. D., Lei, Y., Teo, L. W. and Choi, W. K. (2003) Monitoring oxide quality using the spread of the dC/dV peak in scanning capacitance microscopy measurements. IEEE Electron Device Letters, 24 10: 667-670. doi:10.1109/LED.2003.817390 200 210 8 Cited 10 times in Scopus10 0