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Mor, T, Ou, D R, Ye, F, Zou, J and Drennan, J (2006). A design on nano-hetero strucutre in Dy doped CeO2 solid electrolytes using a combined process of spart plasma sintering and conventional sintering. In: 5th International Conference of Inorganic Materials. 5th International Conference of Inorganic Materials, Slovenia, (). 23-26 September 2006. 75  
Ou, D R, MorI, T, Ye, F, Zou, J and Drennan, J (2006). Comparison between the Y-doped ceria and Ho-doped ceria: Electrolytic properties and microstructure. In: E-MRS Spring Meeting 2006. E-MRS Spring Meeting 2006, Nice, France, (). 20 May - 2 June 2006. 45  
Ye, F, Mori, T, Ou, D R, Zou, J and Drennan, J. (2006). Conductivity and microstructure of CE1-xTbxO2-8(0.. In: E-MRS Spring Meeting 2006. E-MRS Spring Meeting 2006, Nice, France, (). 20 May - 2 June 2006. 41  
Ou, D R, Mori, T, Ye, F, Zou, J and Drennan, J (2006). Grain-size dependence of electrolytic properties in 25 at.% Yttrium Doped Ceria Solid Electrolytes. In: R Yamamoto, EcoDesign 2005 Fourth International Symposium on Environmentally Conscious Design and Inverse Manufacturing. EcoDesign 2005 Fourth International Symposium on Environmentally Conscious Design and Inverse Manufacturing, Japan, (891-893). 2006. 46   0
Ye, F, Mori, T, Ou, D R, Zou, J and Drennan, J (2006). Microstructure and ionic conductivity of Yb-doped ceria. In: 16th International Microscopy Congress. 16th International Microscopy Congress, Sapporo, Japan, (1759). . 33  
Ye, F, Mori, T, Ou, D R, Zou, J and Drennan, J (2006). Relationship between microstructure and ionic conductivity in Ytterbium Doped Ceria. In: R Yamamoto, EcoDesign 2005 Fourth International Symposium on Environmentally Conscious Design and Inverse Manufacturing. EcoDesign 2005 Fourth International Symposium on Environmentally Conscious Design and Inverse Manufacturing, Japan, (894-897). 2006. 49  
Ou, D R, Mori, T, Ye, F, Zou, J and Drennan, J (2006). TEM study of the microstructures in Y-doped ceria and Ho-doped ceria electrolytes. In: 16th International Microscopy Congress. 16th International Microscopy Congress, Sapporo, Japan, (1169). . 40