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Li, F. H., Fan, Y. L., Yang, X. J., Jiang, Z. M., Wu, Q. and Zou, J. (2006) Atomic composition profile change of SiGe islands during Si capping. Applied Physics Letters, 89 10: 103108-1-103108-3. doi:10.1063/1.2345589 72   13 Cited 12 times in Scopus12 0
Wu, Y. Q., Zou, J., LI, F. H., Lin, J. H., Wu, R. W. and Jiang, Z. M. (2006). The stability of faceted SiGe quantum dotes capped with a Si thin layer. In: 16th International Microscopy Congress. 16th International Microscopy Congress, Sapporo, Japan, (1337). 3-8 September, 2006. 57