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Lau, Mei Po Mabel (2002). Characterization of hot-carrier induced degradation via small-signal characteristics in mosfets PhD Thesis, School of Computer Science and Electrical Engineering, The University of Queensland. 125 2
Lau, M. P., Hsu, C. T. and Yeow, T.Y.T. (2001). Investigations of hot-carrier induced interface damages via small-signal characteristics of drain-to-substrate gated-diode. In: W. Tan, K, Pey, W. Chim and J. Thong, Proceedings of the 2001 Eighth International Symposium on the Physical and Failure Analysis of Integrated Circuits. Eighth International Symposium on the Physical and Failure Analysis of Integrated Circuits, Singapore, (249-253). 9-13 July, 2001. doi:10.1109/IPFA.2001.941496 57   3 0