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Hsu, C. T., Lau, M. P., Yeow, T. Y. T. and Yao, Z. Q. (2000). Analysis of hot-carrier-induced degradation in MOSFET's by gate-to-drain and gate-to-substrate capacitance measurements. In: W R Tonti, 2000 IEEE International Reliability Physics Symposium Proceedings 38th Annual. 38th Annual International Reliability Physics Symposium, San Jose, (98-102). 10-13 April 2000. 51  
Lau, M. M., Chiang, C. Y. T., Yeow, Y. T. and Yao, Z. Q. (2001) A new method of threshold voltage extraction via MOSFET gate-to-substrate capacitance measurement. Ieee Transactions On Electron Devices, 48 8: 1742-1744. doi:10.1109/16.936698 123   7 Cited 7 times in Scopus7 0
Lau, M. P., Chiang, Y., Yeow, Y. T. and Yao, Z. Q. (1999). Measurement of VT and Leff using MOSFET gate-substrate capacitance. In: Proceedings of the 1999 International Conference on Microelectronic Test Structures. ICMTS'99, Goteborg, (152-155). 15-18 March 1999. 55