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Hong, Yang David, Yeow, YewTong, Chim, Wai Kin, Yan, Jian and Wong, Kin Mun (2006) Accurate Modeling of the Effects of Fringing Area Interface Traps on Scanning Capacitance Microscopy Measurement. IEEE Transactions on Electron Devices, 53 3: 499-506. doi:10.1109/TED.2005.864367 435 198 1 Cited 1 times in Scopus1 0